Random Access Memories造句怎么写
- 造句
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The Single Event Effect(SEE) simulation experiment was carried out on proton accelerators for Static Random Access Memories(SRAMs).
Investigation of Integrated Ferroelectric Capacitors for Embedded Ferroelectric Random Access Memories;
Expermental methods were emphatically described for measuring the proton Single Event Upset (SEU) cross section in Static Random Access Memories (SRAMs).
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